What does BIT/PM mean?
BIT/PM means Built-In-Test and Performance Monitoring
This acronym/slang usually belongs to Undefined category.
What is the abbreviation for Built-In-Test and Performance Monitoring?
Built-In-Test and Performance Monitoring can be abbreviated as BIT/PM
|
|
Most popular questions people look for before coming to this page
Q: A: |
What does BIT/PM stand for? BIT/PM stands for "Built-In-Test and Performance Monitoring". |
Q: A: |
How to abbreviate "Built-In-Test and Performance Monitoring"? "Built-In-Test and Performance Monitoring" can be abbreviated as BIT/PM. |
Q: A: |
What is the meaning of BIT/PM abbreviation? The meaning of BIT/PM abbreviation is "Built-In-Test and Performance Monitoring". |
Q: A: |
What is BIT/PM abbreviation? One of the definitions of BIT/PM is "Built-In-Test and Performance Monitoring". |
Q: A: |
What does BIT/PM mean? BIT/PM as abbreviation means "Built-In-Test and Performance Monitoring". |
Q: A: |
What is shorthand of Built-In-Test and Performance Monitoring? The most common shorthand of "Built-In-Test and Performance Monitoring" is BIT/PM. |
Abbreviations or Slang with similar meaning
- ABITE - Antenna Built-In Test Equipment
- BBIT - Background Built-In Test
- C-BIT - Continuous Built-In Test
- CADBIT - Computer Aided Design for Built-In Test
- DBITS - Dynamic Built-in Test and Simulation System
- I-BIT - Interruptive Built-In Test
- IPBIT - Initial Power-Up Built in Test
- BITE - Built-In Test Equipment
- BITS - Built-In Test System
- BITD - Built in Test Diagnostics
- BIT - Built-In Test
- TPTP - Test and Performance Tools Platform
- BEST - Built in Evaluation and Self Test
- BITE - Built In Test Equipment/Battle Management Interoperability T&E Training Exercises
- BITE - Built In Test Evaluation
- COMPONENT - Development and Applications of New Built-in-Test Software Components in European Industries
- LTE/BIT - Built In Test During Launch-To-Eject Cycle
- tptp - Test and Performance Tool Platform
- tptp - Test and Performance Tools Project
- ARINC 604 - Guidance For Design And Use Of built-In Test Equipment