|
AAS |
Atomic Absorption Spectroscopy |
|
|
AED |
Auger Electron Diffraction |
|
|
AES |
Auger Electron Spectroscopy |
|
|
AFM |
Atomic Force Microscopy |
|
|
AFS |
Atomic Fluorescence Spectroscopy |
|
|
APFIM |
Atom Probe Field Ion Microscopy |
|
|
APS |
Appearance Potential Spectroscopy |
|
|
ATR |
Attenuated Total Reflectance |
|
|
AXRS |
Anomalous X-Ray Scattering |
|
|
BiFC |
Bimolecular Fluorescence Complementation |
|
|
BKD |
Backscatter Kikuchi Diffraction |
|
|
BRET |
Bioluminescence Resonance Energy Transfer |
|
|
BSED |
Back Scattered Electron Diffraction |
|
|
CAICISS |
Coaxial Impact Collision Ion Scattering Spectroscopy |
|
|
CARS |
Coherent Anti-Stokes Raman Spectroscopy |
|
|
CBED |
convergent beam electron diffraction patterns |
|
|
CCM |
Charge Collection Microscopy |
|
|
CDI |
Coherent Diffraction Imaging |
|
|
CET |
Cryo-Electron Tomography |
|
|
CL |
Cathodoluminescence |
|
|
CLSM |
Confocal Laser Scanning Microscopy |
|
|
COSY |
Correlation Spectroscopy |
|
|
cryo-EM |
Cryo-electron microscopy |
|
|
CV |
Cyclic Voltammetry |
|
|
dHvA |
de Haas van Alphen |
|
|
DIC |
Differential Interference Contrast |
|
|
DLS |
Dynamic Light Scattering |
|
|
DLTS |
Deep-Level Transient Spectroscopy |
|
|
DMA |
Dynamic Mechanical Analysis (for Elastomers) |
|
|
DSC |
Differential Scanning Calorimetry |
|
|
DTA |
Differential Thermal Analysis |
|
|
DVS |
Dynamic Vapour Sorption |
|
|
EBIC |
Electron Beam-induced Current |
|
|
ECOSY |
Exclusive Correlation Spectroscopy |
|
|
ECT |
Electrical Capacitance Tomography |
|
|
EDAX |
energy dispersive analysis of X-rays |
|
|
EDMR |
Electrically Detected Magnetic Resonance |
|
|
EDX |
energy-dispersive X-ray spectrometry |
|
|
EDX |
Energy-Dispersive X-ray Analysis |
|
|
EELS |
Electron Energy Loss Spectroscopy |
|
|
EFTEM |
Energy-filtered Transmission Electron Microscopy |
|
|
EID |
Electron-Induced Desorption |
|
|
EL |
electroluminescence |
|
|
ELS |
Electrophoretic Light Scattering |
|
|
EPMA |
Electron Probe Microanalysis |
|
|
EPR |
Electron Paramagnetic Resonance |
|
|
ERT |
Electrical Resistivity Tomography |
|
|
ES-MS |
electrospray mass spectrometry |
|
|
ESCA |
photoelectron spectroscopy for chemical analysis |
|
|
ESD |
Electron-Stimulated Desorption |
|
|
ESEM |
Environmental Scanning Electron Microscopy |
|
|
ESI-MS |
electrospray ionization mass spectrometry |
|
|
ESR |
Electron Spin Resonance |
|
|
ESTM |
Electrochemical Scanning Tunneling Microscopy |
|
|
EXAFS |
Extended X-Ray Absorption Fine Structure |
|
|
EXSY |
Exchange Spectroscopy |
|
|
FCCS |
fluorescence cross-correlation spectroscopy |
|
|
FCS |
Fluorescence Correlation Spectroscopy |
|
|
FEM |
Field-Emission Microscopy |
|
|
FIB |
Focused Ion Beam |
|
|
FIM-AP |
Field Ion Microscopy - Atom Probe |
|
|
IRS |
Infrared Spectroscopy |
|
|
ISS |
Ion Scattering Spectroscopy |
|
|
IVEM |
Intermediate Voltage Electron Microscopy |
|
|
LALLS |
Low-Angle Laser Light Scattering |
|
|
LC-MS |
Liquid Chromotography with Mass Spectrometry |
|
|
LEED |
Low-energy Electron Diffraction |
|
|
LEEM |
Low-energy Electron Microscopy |
|
|
LEIS |
Low-Energy Ion-Scattering |
|
|
LIBS |
Laser-Induced Breakdown Spectroscopy |
|
|
LOES |
Laser-Optical Emission Spectroscopy |
|
|
MALDI |
Matrix-assisted laser desorption/ionization |
|
|
MEIS |
Medium Energy Ion Scattering |
|
|
MFM |
Magnetic Force Microscopy |
|
|
MTA |
Microthermal Analysis |
|
|
NAA |
Neutron Activation Analysis |
|
|
Nanovid microscopy |
Nanovid Microscopy |
|
|
ND |
Neutron Diffraction |
|
|
NDP |
Neutron Department Profiling |
|
|
NEXAFS |
Near-Edge X-ray Absorption Fine Structure |
|
|
NIS |
Nuclear Inelastic Scattering |
|
|
NOESY |
Nuclear Overhauser Effect Spectroscopy |
|
|
NSOM |
Near-Field Optical Microscopy |
|
|
OBIC |
Optical Beam Induced Current |
|
|
ODNMR |
Optically Detected Magnetic Resonance |
|
|
OES |
Optical Emission Spectroscopy |
|
|
PACT |
Photoacoustic Computed Tomography |
|
|
PAS |
Positron Annihilation Spectroscopy |
|
|
PAT |
Photoacoustic Tomography |
|
|
PAX |
Photoemission Of Adsorbed Xenon |
|
|
PC |
Photocurrent |
|
|
PCS |
Photocurrent Spectroscopy |
|
|
PD |
Photodesorption |
|
|
PDEIS |
Potentiodynamic Electrochemical Impedance Spectroscopy |
|
|
PED |
Photoelectron Diffraction |
|
|
PEELS |
Parallel Electron Energy Loss Spectroscopy |
|
|
PES |
Photoelectron Spectroscopy |
|
|
PIXE |
Particle Induced X-Ray Spectroscopy |
|
|
PIXE |
Proton Induced X-Ray Spectroscopy |
|
|
PL |
Photo Luminescence |
|
|
PTMS |
Photothermal Microspectroscopy |
|
|
QENS |
Quasielastic Neutron Scattering |
|
|
Raman |
Raman Spectroscopy |
|
|
RAXRS |
Resonant Anomalous X-Ray Scattering |
|
|
REM |
Reflection Electron Microscopy |
|
|
RHEED |
Reflection High-energy Electron Diffraction |
|
|
RIXS |
Resonant Inelastic X-ray Scattering |
|
|
RR |
resonance Raman |
|
|
SAD |
Selected Area Diffraction |
|
|
SAED |
Selected Area Electron Diffraction |
|
|
SAM |
Scanning Auger Microscopy |
|
|
SANS |
Small-Angle Neutron Scattering |
|
|
SAXS |
Small Angle Xray Scattering |
|
|
SCANIIR |
Surface Composition By Analysis Of Neutral Species And Ion-Impact Radiation |
|
|
SCEM |
Scanning Confocal Electron Microscopy |
|
|
SE |
Spectroscopic Ellipsometry |
|
|
SEC |
Size Exclusion Chromatography |
|
|
SEIRA |
Surface Enhanced Infrared Absorption Spectroscopy |
|
|
SEM |
Sionscanning Electron Microscopy |
|
|
SERS |
Surface-Enhanced Raman Spectroscopy |
|
|
SEXAFS |
Surface Extended X-Ray Absorption Fine Structure |
|
|
SICM |
Scanning Ion Conductance Microscopy |
|
|
SIMS |
Secondary Ion Mass Spectrometry |
|
|
snms |
Sputtered Neutral Species Mass Spectroscopy |
|
|
SNOM |
Scanning Nearfield Optical Microscopy |
|
|
SPM |
Scanning Probe Microscopy |
|
|
SRM-CE/MS |
Selected-Reaction-Monitoring Capillary-Electrophoresis Mass-Spectrometry |
|
|
SSNMR |
Solid-State Nuclear Magnetic Resonance |
|
|
STEM |
Storable Tubular Extendible Member |
|
|
STM |
Scanning Tunneling Microscopy |
|
|
sts |
Scanning Tunneling Microscopy |
|
|
tact |
Thermoacoustic Computed Tomography |
|
|
tat |
Thermoacoustic Tomography |
|
|
TGA |
Thermogravimetric Analysis |
|
|
TIRFM |
Total Internal Reflection Fluorescence Microscopy |
|
|
TMA |
Thermomechanical Analysis |
|
|
TXRF |
Total Reflection X-ray Fluorescence Analysis |
|
|
UPS |
UV Photoelectron Spectroscopy |
|
|
VEDIC |
Video-Enhanced Differential Interference Contrast Microscopy |
|
|
WAXS |
wide-angle X-ray scattering |
|
|
WDS |
Wavelength-Dispersive Spectroscopy |
|
|
WDX |
Wavelength Dispersive X-Ray Spectroscopy |
|
|
X-CTR |
X-Ray Crystal Truncation Rod Scattering |
|
|
XAES |
X-Ray Induced Auger Electron Spectroscopy |
|
|
XAS |
X-Ray Absorption Spectroscopy |
|
|
xds |
X-Ray Diffuse Scattering |
|
|
XPEEM |
X-Ray Photoelectron Emission Microscopy |
|
|
XPS |
X-Ray Photoelectron Spectroscopy |
|
|
XRR |
X-ray Reflectivity |
|
|
XRS |
X-ray Raman scattering |
|